ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,553,838, issued on Feb. 17, was assigned to UCHICAGO ARGONNE LLC (Chicago).
"High resolution x-ray reflectometer" was invented by Raymond P. Conley (Glen Ellyn, Ill.), Kael Seaver (Chicago), Deming Shu (Darien, Ill.), Scott J. Izzo (Standish, Mich.) and Lahsen Assoufid (Chicago).
According to the abstract* released by the U.S. Patent & Trademark Office: "A high-resolution x-ray reflectometer system that is for characterization of mirrors for use with advanced light sources and includes a table, arc, and sample stage. The table and arc may be made of the same material, in some configurations that material is granite. An x-ray source and detector are mounted on the arc. The arc is mova...