US Patent Issued to Tyco Electronics (Shanghai), TE Connectivity Solutions, AMP Amermex on May 19 for "Self calibration formal inspection system and method of using it to inspect article" (Chinese, American, Mexican Inventors)

ALEXANDRIA, Va., May 19 -- United States Patent no. 12,631,567, issued on May 19, was assigned to Tyco Electronics (Shanghai) Co. Ltd. (Shanghai), TE Connectivity Solutions GmbH (Schaffhausen, Switzerland) and AMP Amermex S.A. de C.V. (Chiauhua, Mexico).

"Self calibration formal inspection system and method of using it to inspect article" was invented by Lei (Alex) Zhou (Shanghai), Dandan (Emily) Zhang (Shanghai), Roberto Francisco-Yi Lu (Bellevue, Wash.), Rong Zhang (Shanghai), Angel Alberto Slistan (Sonora, Mexico), Jorge Enrique Clayton (Sonora, Mexico), Sonny O Osunkwo (Middletown, Pa.), Jiankun (Jerry) Zhou (Middletown, Pa.) and Xianghao (Jorge) Bao (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office...