US Patent Issued to Tsinghua University, NUCTECH on June 16 for "Radiographic inspection device and method of inspecting object" (Chinese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,653,336, issued on June 16, was assigned to Tsinghua University (Beijing) and NUCTECH COMPANY Ltd. (Beijing).

"Radiographic inspection device and method of inspecting object" was invented by Li Zhang (Beijing), Zhiqiang Chen (Beijing), Qingping Huang (Beijing), Jinning Liang (Beijing), Mingzhi Hong (Beijing), Yi Cheng (Beijing), Minghua Qiu (Beijing), Yao Zhang (Beijing), Jianxue Yang (Beijing) and Lei Zheng (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "A radiographic inspection device and a method of inspecting an object are provided. The radiographic inspection device includes: a support frame, where an inspection space applicable to inspect...