US Patent Issued to TRANSTECH SYSTEMS on Sept. 9 for "Methods, circuits and systems for obtaining impedance or dielectric measurements of a material under test" (New York, California Inventors)

ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,411,101, issued on Sept. 9, was assigned to TRANSTECH SYSTEMS INC. (Latham, N.Y.).

"Methods, circuits and systems for obtaining impedance or dielectric measurements of a material under test" was invented by Adam D. Blot (Altamont, N.Y.), Manfred Geier (Oakland, Calif.) and Andrew J. Westcott (Troy, N.Y.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Certain disclosed methods include: transmitting an excitation signal into the MUT and transmitting a reference signal to a set of magnitude and phase (M/P) detectors; receiving the response signal; separately comparing a magnitude and phase for each of the excitation signal and the reference signal with cor...