ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,565, issued on Feb. 24, was assigned to TRANSTECH SYSTEMS INC. (Latham, N.Y.).
"Electromagnetic impedance spectroscopy apparatus and related planar sensor system" was invented by Manfred Geier (Oakland, Calif.), Adam D. Blot (Altamont, N.Y.) and Andrew J. Westcott (Troy, N.Y.).
According to the abstract* released by the U.S. Patent & Trademark Office: "According to various implementations, an apparatus for electromagnetic impedance spectrographic characterization of a material under test (MUT) includes: a planar array of at least two electrodes configured to be placed in electromagnetic communication with the MUT, wherein during operation of the planar array, at least one of the ...