US Patent Issued to TOPPAN on July 14 for "Examination marker and examination marker set" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,678,262, issued on July 14, was assigned to TOPPAN INC. (Tokyo).

"Examination marker and examination marker set" was invented by Saeko Nomura (Tokyo), Ryo Shoda (Tokyo) and Junya Tanabe (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An examination marker for use in diagnostic imaging using microwaves. The examination marker includes a marker main body to be attached to an examination target. The marker main body is capable of displaying, on the marker main body, an index for use in scanning the examination target marker and is deformable following the shape of the examination target. The marker main body has a relative permittivity of 10 or less ...