US Patent Issued to TOPCON on July 15 for "Surveying instrument and surveying system" (Japanese Inventor)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,359,915, issued on July 15, was assigned to TOPCON Corp. (Tokyo-to, Japan).

"Surveying instrument and surveying system" was invented by Nobuyuki Nishita (Tokyo-to, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a surveying instrument including a surveying instrument main body, in which the surveying instrument main body includes a distance measuring module configured to project the distance measuring light toward an object and to perform the distance measurement, an optical axis deflector configured to at least uniaxially perform a scan using the distance measuring light, a storage module configured to store a two-dimensional map, and ...