US Patent Issued to TOKYO SEIMITSU on Sept. 8 for "Three-dimensional shape measuring device, reference surface position adjustment method therefor, and measurement mode switching method therefor" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,729,949, issued on Sept. 8, was assigned to TOKYO SEIMITSU Co. LTD. (Tokyo).

"Three-dimensional shape measuring device, reference surface position adjustment method therefor, and measurement mode switching method therefor" was invented by Yoshiyuki Kawata (Tsuchiura-city, Japan), Katsufumi Moriyama (Tsuchiura-city, Japan) and Hideki Morii (Tsuchiura-city, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A three-dimensional shape measuring device includes a holder that changes the reference light path length in response to temperature change, and a temperature adjusting unit that adjusts a temperature of the holder to a target temperature, so as to m...