US Patent Issued to Tokyo Electron on May 26 for "Testing device and method, and non-transitory computer-readable recording medium" (Japanese Inventors)

ALEXANDRIA, Va., May 26 -- United States Patent no. 12,638,494, issued on May 26, was assigned to Tokyo Electron Ltd. (Tokyo).

"Testing device and method, and non-transitory computer-readable recording medium" was invented by Shinjiro Watanabe (Yamanashi, Japan) and Taisei Kondo (Hokkaido, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A testing device includes photographing, segmenting, position determining, and position adjusting units. The photographing unit is configured to photograph a needle tip of a probe needle provided in a probe card used for testing of a test object. The segmenting unit is configured to recognize a needle region and a needle tip region of a validation image photographed by t...