US Patent Issued to THE WAVE TALK on Dec. 2 for "Accurate turbidity measurement system and method, using speckle pattern" (South Korean Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,176, issued on Dec. 2, was assigned to THE WAVE TALK INC. (Daejeon, South Korea).

"Accurate turbidity measurement system and method, using speckle pattern" was invented by Young Dug Kim (Seongnam-si, South Korea) and Kyoung Man Cho (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is an accurate turbidity measurement system and method, using a speckle pattern, in which a speckle pattern may be used for turbidity measurement, thereby enabling turbidity and bacterial or microbial contamination to be measured with high accuracy. The system may include: a measuring container which has a light input part formed in one side thereo...