ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,707,734, issued on Aug. 11, was assigned to THE RESEARCH FOUNDATION FOR THE STATE UNIVERSITY OF NEW YORK (Albany, N.Y.).
"Fabrication method for fused multi-layer amorphous selenium sensor" was invented by James Scheuermann (Katonah, N.Y.) and Wei Zhao (East Setauket, N.Y.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A sensor including a layer of amorphous selenium (a-Se) and at least one charge blocking layer is formed by depositing the charge blocking layer over a substrate prior to depositing the amorphous selenium, enabling the charge blocking layer to be formed at elevated temperatures. Such a process is not limited by the crystallization tempera...