ALEXANDRIA, Va., April 15 -- United States Patent no. 12,602,449, issued on April 14, was assigned to The Research Foundation for The State University of New York (Binghamton, N.Y.).

"Pattern change discovery between high dimensional data sets" was invented by Yi Xu (Endwell, N.Y.) and Zhongfei Mark Zhang (Vestal, N.Y.).

According to the abstract* released by the U.S. Patent & Trademark Office: "The general problem of pattern change discovery between high-dimensional data sets is addressed by considering the notion of the principal angles between the subspaces is introduced to measure the subspace difference between two high-dimensional data sets. Current methods either mainly focus on magnitude change detection of low-dimensional data se...