US Patent Issued to THE REGENTS OF THE UNIVERSITY OF MICHIGAN, UCHICAGO ARGONNE, DOW GLOBAL TECHNOLOGIES on Dec. 16 for "Recovering atomic-scale chemistry from fused multi-modal electron microscopy" (Michigan, Illinois Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,336, issued on Dec. 16, was assigned to THE REGENTS OF THE UNIVERSITY OF MICHIGAN (Ann Arbor, Mich.), UCHICAGO ARGONNE LLC (Chicago) and DOW GLOBAL TECHNOLOGIES LLC (Midland, Mich.).

"Recovering atomic-scale chemistry from fused multi-modal electron microscopy" was invented by Robert Hovden (Ann Arbor, Mich.), Jonathan Schwartz (Ann Arbor, Mich.), Yi Jiang (Lemont, Ill.), Zichao Wendy Di (Darien, Ill.), Steven J. Rozeveld (Midland, Mich.) and Huihuo Zheng (Glen Ellyn, Ill.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods for fused multi-modal electron microscopy are provided to generate quantitatively accurate 2D maps or 3D volumes...