US Patent Issued to The Florida International University Board of Trustees on July 21 for "Acoustic emission-based indentation deformation monitoring system for indentation plastometry" (Florida Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,471, issued on July 21, was assigned to The Florida International University Board of Trustees (Miami).

"Acoustic emission-based indentation deformation monitoring system for indentation plastometry" was invented by Arvind Agarwal (Miami), Sarvesha Rajashekara (Miami) and Gonzalo Seisdedos Rodriguez (Miami).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods are provided for acquisition of acoustic emission during indentation. An acoustic transducer can be used during indentation of a sample to acquire AE and capture valuable information concerning internal structural changes occurring within the material of the sample during the inden...