US Patent Issued to The ADT Security on Feb. 24 for "Systems and methods for testing functionality and performance of a sensor and hub" (Florida Inventor)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,645, issued on Feb. 24, was assigned to The ADT Security Corp. (Boca Raton, Fla.).

"Systems and methods for testing functionality and performance of a sensor and hub" was invented by Jeron E. Bornstein (Delray Beach, Fla.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system for testing a sensor and a hub is provided. The system includes a testing control device and a sensor testing device. The testing control device is configured to select a testing profile based at least in part on the sensor, and transmit a testing initiation signal based at least in part on the testing profile. The sensor testing device is configured to perform testing of the ...