US Patent Issued to TEXAS INSTRUMENTS on July 14 for "High voltage integrated circuit testing interface assembly" (Taiwanese, American Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,076, issued on July 14, was assigned to TEXAS INSTRUMENTS Inc. (Dallas).

"High voltage integrated circuit testing interface assembly" was invented by Ming-Chuan You (New Taipei City, Taiwan), Andrew Patrick Couch (Allen, Texas), Phillip Marcus Blitz (Garland, Texas), Xinkun Huang (McKinney, Texas), Chi-Tsung Lee (New Taipei City, Taiwan), Roy Deidrick Solomon (Melissa, Texas) and Enis Tuncer (Dallas).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit testing assembly that includes: (i) a first slug configured to contact a first surface of a first set of pins of an integrated circuit; (ii) a second slug configured to contact a second...