US Patent Issued to Texas Instruments on Feb. 17 for "Methods, apparatus, and articles of manufacture to determine memory access integrity based on feedback from memory" (American, Indian Inventors)

ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,554,579, issued on Feb. 17, was assigned to Texas Instruments Inc. (P.O. Box 655474 Dallas, Texas).

"Methods, apparatus, and articles of manufacture to determine memory access integrity based on feedback from memory" was invented by Saya Goud Langadi (Bangalore, India) and David Peter Foley (Sugar Land, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, apparatus, systems, and articles of manufacture are disclosed to determine memory access integrity based on feedback from memory. An example apparatus includes an access reconstruction controller including an output, a first input configured to be coupled to memory, and a second input configur...