ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,550,741, issued on Feb. 10, was assigned to TEXAS INSTRUMENTS Inc. (Dallas).
"Protruded scribe feature delamination mitigation" was invented by Jaimal Williamson (Dallas) and Guangxu Li (Dallas).
According to the abstract* released by the U.S. Patent & Trademark Office: "An electronic device includes a semiconductor die having a semiconductor body, a metallization structure over the semiconductor body, a protective overcoat layer over the metallization structure, a polyimide layer over the protective overcoat layer, a crack arrest structure including contiguous metal crack arrest features in the metallization structure that extend from the protective overcoat layer toward the semicon...