ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,845, issued on July 14, was assigned to TEWS ELEKTRONIK GMBH & Co. KG (Hamburg, Germany).
"Method for calibrating a measuring apparatus" was invented by Hendrik Richter (Hamburg, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for calibrating a measuring apparatus includes measuring a set of measured values for products including one or more measured variables. A first set of calibration parameters is determined having one or more weights for one or more of the products. The one or more products is grouped within a first product family. Some of the products in the first product family comprise an equal weight. At least a second set o...