US Patent Issued to Test Research on June 23 for "Electrical testing equipment" (Taiwanese Inventors)

ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,467, issued on June 23, was assigned to Test Research Inc. (Taipei City, Taiwan).

"Electrical testing equipment" was invented by Yi Tsao (Taipei City, Taiwan), Hsien Hung Chen (Taipei City, Taiwan) and Yi-Hua Pan (Taipei City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electrical testing equipment includes a machine, a pair of conveyor rails and a first moving device. The machine has a supporting surface. The supporting surface is configured to support a fixture assembly. The conveyor rails are configured to deliver a device under test. The conveyor rails are separated from the supporting surface by a distance. The first moving device ...