US Patent Issued to Terna, Planetek Italia on Feb. 24 for "Innovative method for the detection of deformed or damaged structures based on the use of single SAR images" (Italian Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,701, issued on Feb. 24, was assigned to Terna S.P.A. (Rome) and Planetek Italia S.R.L. (Bari, Italy).

"Innovative method for the detection of deformed or damaged structures based on the use of single SAR images" was invented by Vincenzo Massimi (Bari, Italy), Davide Oscar Nitti (Bari, Italy), Raffaele Nutricato (Bari, Italy), Sergio Samarelli (Bari, Italy), Marco Forteleoni (Rome), Sabrina Viola (Rome), Anna Esposito (Rome) and Emilia Montesarchio (Rome).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention concerns a method (1) to detect deformations of, and/or damages to, structures permanently arranged on the earth's surface. In particular,...