ALEXANDRIA, Va., March 31 -- United States Patent no. 12,591,007, issued on March 31, was assigned to Teradyne Inc. (North Reading, Mass.).

"Determining a correlation between power disturbances and data errors in a test system" was invented by Christopher C. Jones (Winchester, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An example system for testing a device under test (DUT) includes one or more processing devices configured to receive first data from the DUT over a communication channel, and to analyze the first data to identify an error associated with the communication channel; and a power supply controller configured to receive second data based on a power disturbance from the DUT, and to compar...