ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,725,071, issued on Sept. 1, was assigned to Tencent Technology Co. Ltd. (Shenzhen, China).
"Calibration method and apparatus for qubit gate, electronic device, and medium" was invented by Xiong Xu (Shenzhen, China), Zhenxing Zhang (Shenzhen, China), Yicong Zheng (Shenzhen, China), Tianyu Zhang (Shenzhen, China) and Shengyu Zhang (Shenzhen, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a method for calibrating a qubit gate performed by an electronic device. The method includes: obtaining a first fidelity of a first qubit gate from qubit gates for processing a qubit; determining a first fidelity interval including th...