ALEXANDRIA, Va., March 31 -- United States Patent no. 12,593,646, issued on March 31, was assigned to TEL Manufacturing and Engineering of America Inc. (Chaska, Minn.).

"Automated fault detection in microfabrication" was invented by Matthew Gwinn (Winchendon, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method including: collecting first processing tool machine data from a first processing tool while treating semiconductor substrates, the first processing tool machine data including process data and operational codes associated with one or more discrete intervals of time during the treatments, training a first neural network with the first processing tool machine data from the first processing tool...