ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,325, issued on July 28, was assigned to Tektronix Inc. (Beaverton, Ore.).
"System and method for determining probe skew" was invented by Vivek Shivaram (Bengaluru, India), Niranjan R Hegde (Siddapur, India), Shubha B (Bengaluru, India), Krishna N H Sri (Bengaluru, India), Yogesh M. Pai (Bengaluru, India) and Venkatraj Melinamane (Bengaluru, India).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system for determining an amount of time skew between two measurement probes includes a first probe and a second probe and one or more processors configured to measure a current signal from a Device Under Test (DUT) through the first probe, measure a voltage ...