US Patent Issued to Tektronix on July 21 for "Separating noise to increase machine learning prediction accuracy in a test and measurement system" (Oregon Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,563, issued on July 21, was assigned to Tektronix Inc. (Beaverton, Ore.).

"Separating noise to increase machine learning prediction accuracy in a test and measurement system" was invented by John J. Pickerd (Hillsboro, Ore.) and Kan Tan (Portland, Ore.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test and measurement instrument has an input port to allow the instrument to receive one or more waveforms from a device under test (DUT), one or more low pass filters to remove a portion of the noise from the one or more waveforms, and one or more processors to: select a waveform pattern from the waveforms, measure noise in the one or more waveforms an...