ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,630, issued on Feb. 24, was assigned to Tektronix Inc. (Beaverton, Ore.).
"Entropy on one-dimensional and two-dimensional histograms" was invented by Kan Tan (Portland, Ore.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test and measurement device has a port to receive a signal from a device under test (DUT), one or more analog-to-digital converters (ADC) to digitize the signal to create one or more waveforms, a display, and one or more processors configured to execute code that causes the one or more processors to: generate a histogram from the waveform, the histogram having one or more dimensions; and calculate one or more entropy values for ea...