US Patent Issued to Tektronix on April 7 for "Optical tuning test system using parallel oven pipelines with parallel instrument channels and machine learning assistance" (Oregon Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,145, issued on April 7, was assigned to Tektronix Inc. (Beaverton, Ore.).

"Optical tuning test system using parallel oven pipelines with parallel instrument channels and machine learning assistance" was invented by John J. Pickerd (Hillsboro, Ore.) and Evan Douglas Smith (Portland, Ore.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test system includes a test and measurement instrument, ovens to hold devices under test (DUT), each oven having an oven switch selectably connected to the DUTs, channel switches selectably connected to the oven switches and to one channel of the instrument, one or more processors to: select an oven and its oven switch...