US Patent Issued to Techolution Consulting on Sept. 8 for "AI driven system for x-ray analysis of various products and identifying defects within" (New York Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,254, issued on Sept. 8, was assigned to Techolution Consulting LLC (New York).

"AI driven system for x-ray analysis of various products and identifying defects within" was invented by Luv Tulsidas (New York) and Asher Williams (New York).

According to the abstract* released by the U.S. Patent & Trademark Office: "An AI-driven system crafted for the precise X-ray analysis of a variety of objects and identifying defects with high accuracy. Specifically, the system conducts a thorough X-ray analysis of products, systematically identifying defects part by part (using a co-pilot interface) and categorizing them with precision as either pass (non-defective) or fail (defective).In this ...