US Patent Issued to TECHNION RESEARCH & DEVELOPMENT FOUNDATION, FORSCHUNGSVERBUND BERLIN on Feb. 10 for "Methods for characterizing chirality" (Israeli, German Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,704, issued on Feb. 10, was assigned to TECHNION RESEARCH & DEVELOPMENT FOUNDATION Ltd. (Haifa, Israel) and FORSCHUNGSVERBUND BERLIN E.V. (Berlin).

"Methods for characterizing chirality" was invented by Ofer Neufeld (Haifa, Israel), David Ayuso (Berlin), Gavriel Lerner (Haifa, Israel), Dana Raluca Cireasa (Haifa, Israel), Mikhail Ivanov (Berlin), Olga Smirnova (Berlin) and Oren Cohen (Haifa, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods and systems for detecting chiral characteristic of an analyte, are provided. In some embodiments, the method disclosed herein (e.g. operated by a system) comprises receiving at least one spectral line...