US Patent Issued to TDK on Sept. 15 for "Element array circuit, element array circuit unit, electromagnetic wave sensor, temperature sensor, and strain sensor" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,378, issued on Sept. 15, was assigned to TDK Corp. (Tokyo).

"Element array circuit, element array circuit unit, electromagnetic wave sensor, temperature sensor, and strain sensor" was invented by Tadao Senriuchi (Tokyo), Shinji Hara (Tokyo), Susumu Aoki (Tokyo) and Naoki Ohta (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An element array circuit includes first wirings including respective first parts, second wirings including respective second parts, and impedance elements each coupled to both one of the first wirings and one of the second wirings. The second parts extend in a direction different from that in which the first parts extend. E...