US Patent Issued to TDK on July 7 for "Magnetic array, magnetic array control method, and magnetic array control program" (Japanese Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,677,598, issued on July 7, was assigned to TDK Corp. (Tokyo).

"Magnetic array, magnetic array control method, and magnetic array control program" was invented by Shogo Yamada (Tokyo) and Tatsuo Shibata (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A magnetic array includes: a plurality of magnetoresistance effect elements; and a pulse application device which applies a pulse to each of the plurality of magnetoresistance effect elements, wherein each of the plurality of magnetoresistance effect elements includes domain wall motion layer, ferromagnetic layer, and non-magnetic layer sandwiched between the domain wall motion layer and the ferromagnet...