US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on Sept. 8 for "Dynamic offset calibration circuit and method for operating the same" (Taiwanese Inventor)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,732,178, issued on Sept. 8, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).

"Dynamic offset calibration circuit and method for operating the same" was invented by Chang-Yi Li (Yunlin County, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit includes a first corrector circuit and a second corrector circuit. The first corrector circuit calibrates a first duty cycle of a first clock signal based on an offset calibration code to generate a first output clock signal. The second corrector circuit calibrate a second duty cycle of a second clock signal based on the offset calibration code to generate ...