US Patent Issued to Taiwan Semiconductor Manufacturing on Sept. 29 for "Systems and methods for measurement of a parameter of a DUT" (Taiwanese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,748,146, issued on Sept. 29, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Systems and methods for measurement of a parameter of a DUT" was invented by Tsung-Hsien Tsai (Taoyuan County, Taiwan), Ruey-Bin Sheen (Taichung City, Taiwan), Chih-Hsien Chang (New Taipei City, Taiwan) and Cheng-Hsiang Hsieh (Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems, methods, and circuits for determining a duty cycle of a periodic input signal are provided. A delay element is configured to delay the periodic input signal based on a digital control word. A digital circuit is configured to generate a first digital con...