US Patent Issued to Taiwan Semiconductor Manufacturing on Sept. 29 for "System and method for conducting built-in self-test of memory macro" (Canadian, Chinese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,749,552, issued on Sept. 29, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"System and method for conducting built-in self-test of memory macro" was invented by Ted Wong (Hsinchu, China), Saman Adham (Kanata, Canada) and Marat Gershoig (Ottawa).

According to the abstract* released by the U.S. Patent & Trademark Office: "Performing a built-in self-test (BIST) on a memory macro includes generating a plurality of input vectors. One input vector is transmitted to the memory macro in each of a plurality of cycles. Each of the plurality of input vectors is associated with a bit width. Generating the input vector includes generating a partial input vector o...