US Patent Issued to Taiwan Semiconductor Manufacturing on Nov. 3 for "Fault detection of circuit based on virtual defects" (American, Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,783,768, issued on Nov. 3, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Fault detection of circuit based on virtual defects" was invented by Yue Tian (Hsinchu, Taiwan) and Sandeep Kumar Goel (Dublin, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein are related to a method, a device, and a non-transitory computer readable medium for testing a circuit model in an integrated circuit. In one aspect, to each of a plurality of sets of input conditions of a circuit model, a corresponding virtual defect is assigned. The virtual defect may be generated irrespective of a physical characteristic of an integra...