US Patent Issued to Taiwan Semiconductor Manufacturing on March 31 for "Test pattern generation systems and methods" (Taiwanese Inventors)

ALEXANDRIA, Va., March 31 -- United States Patent no. 12,591,730, issued on March 31, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Test pattern generation systems and methods" was invented by Fu-An Tien (Hsinchu, Taiwan), Hsu-Ting Huang (Hsinchu, Taiwan) and Ru-Gun Liu (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods are provided for generating test patterns. In various embodiments, systems and methods are provided in which machine learning is utilized to generate the test patterns in a manner so that the test patterns conform with design rule check (DRC) specified for a particular semiconductor manufacturing process or for particular type...