ALEXANDRIA, Va., March 17 -- United States Patent no. 12,578,645, issued on March 17, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).
"Method of manufacturing a semiconductor device" was invented by Ching-Yu Chang (Yuansun Village, Taiwan), An-Ren Zi (Hsinchu City, Taiwan) and Chin-Hsiang Lin (Hsinchu, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of manufacturing a semiconductor device includes forming a photoresist layer over a substrate and applying a base composition to the photoresist layer, the base composition includes non-organic base, organic base, thermal base generator, or photobase generator. The photoresist layer is selectively exposed to actin...