ALEXANDRIA, Va., June 16 -- United States Patent no. 12,657,365, issued on June 16, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).
"Fault diagnostics" was invented by Sandeep Kumar Goel (Dublin, Calif.) and Ankita Patidar (San Jose, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Process for determining defects in cells of a circuit is provided. A layout of a circuit is received. The layout comprises a first cell and a second cell separated by a boundary circuit. Bridge pairs for the first cell and the second cell is determined. The bridge pairs comprises a first plurality of boundary nodes of the first cell paired with a second plurality of boundary nodes of the second ...