US Patent Issued to Taiwan Semiconductor Manufacturing on July 14 for "Semiconductor system inspection tool and methods of operation" (Taiwanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,684,679, issued on July 14, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Semiconductor system inspection tool and methods of operation" was invented by Jou-Hsuan Lu (New Taipei City, Taiwan), Chiao-Hua Cheng (Tainan City, Taiwan), Cheng-Hsuan Wu (New Taipei City, Taiwan), Ko-Ching Hou (Taipei City, Taiwan), Jyun-Yan Chuang (Hsinchu City, Taiwan), Cheng-Hao Lai (Taichung City, Taiwan), Yu-Kuang Sun (Hsinchu City, Taiwan), Sheng-Kang Yu (Hsinchu City, Taiwan), Shang-Chieh Chien (New Taipei City, Taiwan), Li-Jui Chen (Hsinchu City, Taiwan) and Heng-Hsin Liu (New Taipei City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Of...