US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on Feb. 24 for "Bit error detection in a compute-in-memory system, method of operating same, and method of manufacturing same" (Taiwanese Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,561,205, issued on Feb. 24, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).

"Bit error detection in a compute-in-memory system, method of operating same, and method of manufacturing same" was invented by Brian Crafton (Hsinchu, Taiwan) and Xiaoyu Sun (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A compute-in-memory memory (CIM) system includes: in a first region of a semiconductor die, first components including memory cells correspondingly configured to store single bits, and arrays including multipliers and first bit-error detectors; first ones of the memory cells being arranged in corresponding fir...