US Patent Issued to Taiwan Semiconductor Manufacturing on Aug. 4 for "Systems and methods of testing memory devices" (Taiwanese Inventors)

ALEXANDRIA, Va., Aug. 5 -- United States Patent no. 12,699,668, issued on Aug. 4, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan).

"Systems and methods of testing memory devices" was invented by Meng-Han Lin (Hsinchu City, Taiwan) and Chia-En Huang (Xinfeng Township, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A memory circuit includes a memory array comprising a first portion comprising a plurality of first memory cells, and a second portion comprising a plurality of second memory cells. The memory circuit includes an input/output (I/O) circuit physically disposed next to the memory array along a first lateral direction. The I/O circuit is operatively coupled to the f...