US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING on Aug. 11 for "Delay measurement system and measurement method" (Taiwanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,548, issued on Aug. 11, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan).

"Delay measurement system and measurement method" was invented by Shang Hsien Yang (Hsinchu City, Taiwan), Chung-Chieh Yang (Hsinchu County, Taiwan), Yung-Chow Peng (Hsinchu, Taiwan) and Chih-Chiang Chang (Taipei City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A delay measurement system and a measurement method are provided. The delay measurement system includes a delay control device and a comparator. The delay control device is configured to generate a second signal in response to a first signal, wherein a rising edge of the secon...