US Patent Issued to TAIWAN SEMICONDUCTOR MANUFACTURING, TSMC CHINA on Oct. 20 for "Built-in self-test (BIST) circuit, integrated circuit device and method" (Taiwanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,882, issued on Oct. 20, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan) and TSMC CHINA COMPANY Ltd. (Shanghai).

"Built-in self-test (BIST) circuit, integrated circuit device and method" was invented by Huan-Neng Chen (Hsinchu, Taiwan), Shao-Yu Li (Hsinchu, Taiwan) and CunCun Chen (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A built-in self-test (BIST) circuit includes a first switch, a first resistor, at least one first transistor, and a control circuit. The first switch, the first resistor and the at least one first transistor are coupled in series between a first power supply terminal of a first...