ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,974, issued on Sept. 1, was assigned to TAIKISHA LTD. (Tokyo) and SUBARU Corp. (Tokyo).
"Inspection device and inspection method" was invented by Tadashi Sumii (Tokyo), Hidetsugu Nosaka (Tokyo), Tatsuya Hirose (Tokyo) and Yusuke Tsurui (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are an inspection device and an inspection method capable of controlling the positional relationship between a device and a measurement object to achieve an attitude enabling an appropriate detection of the surface conditions. The inspection device includes: a detector including a transmitter configured to transmit a transmission wave to a measurement obje...