US Patent Issued to SYSTEM SQUARE on April 21 for "Inspection sorting device and sorting device" (Japanese Inventors)

ALEXANDRIA, Va., April 21 -- United States Patent no. 12,605,743, issued on April 21, was assigned to SYSTEM SQUARE INC. (Niigata, Japan).

"Inspection sorting device and sorting device" was invented by Wataru Ando (Nagaoka, Japan), Junji Moriyama (Nagaoka, Japan) and Motofumi Karasawa (Mitsuke, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection sorting device includes a conveying unit that conveys the inspection target; an electromagnetic wave irradiation unit for irradiating electromagnetic waves to the inspection target; an electromagnetic wave detection unit detects electromagnetic waves transmitted through the inspection target; an inspection unit that inspects the inspection target based...