US Patent Issued to SYSMEX on Oct. 20 for "Sample measuring apparatus" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,766,507, issued on Oct. 20, was assigned to SYSMEX Corp. (Kobe, Japan).

"Sample measuring apparatus" was invented by Masato Hayashi (Kobe, Japan), Shuhei Kaneko (Kobe, Japan) and Fumiaki Iwase (Kobe, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A sample measuring apparatus according to one or more embodiments may include a measuring unit that measures a sample in a container, a power supply that supplies power to the measuring unit, and an apparatus housing that accommodates the measuring unit and the power supply inside. In one or more embodiments, the power supply may be arranged in an area in the apparatus housing, the area that is the power ...