US Patent Issued to SYSMEX on May 12 for "Sample measuring method, cartridge, and sample measuring device" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,154, issued on May 12, was assigned to SYSMEX Corp. (Kobe, Japan).

"Sample measuring method, cartridge, and sample measuring device" was invented by Kohei Oda (Kobe, Japan), Hironori Katsumi (Kobe, Japan) and Yoshinori Nakamura (Kobe, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A sample measuring device reduces the frequency with which a user introduces a measurement aid into the sample measuring device is provided. A sample measuring method measures a sample using a container containing a measurement aid which is a solid. The sample measuring method includes loading a predetermined number of measurement aids into a container from a storage ...