US Patent Issued to SYSMEX on Jan. 20 for "Method of generating quality control information, apparatus for generating quality control information, and program" (Japanese Inventor)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,530,769, issued on Jan. 20, was assigned to SYSMEX Corp. (Kobe, Japan).

"Method of generating quality control information, apparatus for generating quality control information, and program" was invented by Hajimu Kawakami (Kobe, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of generating smear quality control information according to an embodiment may include: obtaining a plurality of image data from a plurality of smears, respectively; obtaining, from the plurality of image data, feature values each of which reflects a staining state of each smear; and generating quality control information based on the feature values."

The patent was ...