US Patent Issued to SYSMEX on Dec. 16 for "Method for controlling specimen analysis system and specimen analysis system" (Japanese Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,386, issued on Dec. 16, was assigned to SYSMEX Corp. (Kobe, Japan).

"Method for controlling specimen analysis system and specimen analysis system" was invented by Yuji Wakamiya (Kobe, Japan), Toru Uemura (Kobe, Japan), Yuichiro Ohmae (Kobe, Japan) and Hidetaka Hayama (Kobe, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for controlling a specimen analysis system including at least one measurement unit according to one or more embodiments is disclosed. The method may include automatically starting at least one measurement unit according to a schedule registered by a user; automatically supplying a quality control specimen to the measur...